EXTERIOR INSPECTION DEVICE - DAIICHI JITSUGYO VISWILL CO LTD

Title:

EXTERIOR INSPECTION DEVICE

Document Type and Number:

WIPO Patent Application WO/2011/108160

Kind Code:

A1

Abstract:

Disclosed is an exterior inspection device which has a simple structure compared to a conventional structure and which can keep the manufacturing costs of the simple structure low. The exterior inspection device is provided with: an align and transfer device (25) which is provided with an align and transfer member (26) that has one or a plurality of transfer paths, which is provided with an oscillator (37) for aligning that applies vibrations to the align and transfer member (26), and which aligns objects to be inspected into a line in each transfer path and transfers the objects; a downward slide mechanism (40) which has a downward slide path individually connected to each transfer path of the align and transfer member (26), and which is disposed in a state in which the downward slide path is tilted downward with respect to a line that extends from the transfer path; an imaging device (60) which is arranged near the downward slide path and captures an image of an object being inspected that slides down the downward slide path; and a selection device (80) which analyzes the image of the object being inspected that was captured by the imaging device, determines whether the object being inspected is good or bad, and in accordance with the decision result selects the object being inspected that slides down the downward slide path.

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Inventors:

NELSON RAYMOND (US)
SUZUKI OSAMU (US)

Application Number:

PCT/JP2010/070979

Publication Date:

September 09, 2011

Filing Date:

November 25, 2010

Export Citation:

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Assignee:

DAIICHI JITSUGYO VISWILL CO LTD (JP)
NELSON RAYMOND (US)
SUZUKI OSAMU (US)

International Classes:

B07C5/342

Foreign References:

JP2009279551A	2009-12-03
JPH04346877A	1992-12-02
JPH10305907A	1998-11-17
JP2000097866A	2000-04-07
JPS63218288A	1988-09-12
JPH0646488U	1994-06-28

Attorney, Agent or Firm:

MURAKAMI, Satoshi et al. (JP)
Tomoji Murakami (JP)

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Claims:

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