FINE PARTICLE SAMPLING DEVICE AND FINE PARTICLE SAMPLING METHOD

WIPO Patent Application WO/2022/230655

A1

A fine particle sampling device (10) comprising: a cylindrical first electrode (22) having a first opening located at a first end in the cylindrical axial direction of a cylinder and a second opening located at a second end in the axial direction of the cylinder; a second electrode (24) that extends in the axial direction and that is disposed in the first electrode apart from the inner surface of the first electrode; a third electrode (25) that extends in the axial direction, that is disposed in the first electrode apart from the inner surface, that is thicker than the second electrode, and that is located at a position, in the axial direction, different from the position of the second electrode; a supply part (28) that supplies a liquid to the first electrode so as to cause the liquid to be stored in a portion of the inner surface, in a direction around the axis, of the first electrode; a voltage applying part (26) that applies a first voltage between the first electrode and the second electrode and a second voltage between the first electrode and the third electrode; a drive part (32) that rotates the first electrode about a rotation axial line extending in the axial direction and passing through the first electrode; and a collection part (30) that collects the stored liquid.

NARIHATA KOKI

PCT/JP2022/017562

November 03, 2022

April 12, 2022

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PANASONIC IP MAN CO LTD (JP)

G01N1/02; G01N1/28

WO2016002647A1	2016-01-07
WO2021153155A1	2021-08-05

US20070034025A1	2007-02-15
JPS5464777A	1979-05-24
JP2015114230A	2015-06-22
JP2015108578A	2015-06-11
EP0496092A2	1992-07-29
JP2008161143A	2008-07-17
JP2009011265A	2009-01-22
JP2012052866A	2012-03-15

KAMATA Kenji et al. (JP)

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