FLAT BED SCAN MODULE, FLAT BED SCAN SYSTEM, JIG FOR MEASURING ALIGNMENT ERRORS OF A FLAT BED SCAN MODULE, AND METHOD FOR MEASURING ALIGNMENT ERRORS OF A FLAT BED SCAN MODULE USING SAME

Title:

FLAT BED SCAN MODULE, FLAT BED SCAN SYSTEM, JIG FOR MEASURING ALIGNMENT ERRORS OF A FLAT BED SCAN MODULE, AND METHOD FOR MEASURING ALIGNMENT ERRORS OF A FLAT BED SCAN MODULE USING SAME

Document Type and Number:

WIPO Patent Application WO/2010/134709

Kind Code:

A2

Abstract:

Disclosed are a flat bed scan module, a flat bed scan system, a jig for measuring alignment errors of the flat bed scan module, and a method for measuring alignment errors of the flat bed scan module using same. The flat bed scan module for scanning a shape of a flat panel comprises: a first laser beam oscillation unit and a second laser beam oscillation unit arranged at both ends of one side of a virtual quadrangle, respectively, to emit linear laser beams onto the flat panel; a third laser beam oscillation unit and a fourth laser beam oscillation unit arranged at both ends of the other side of a virtual quadrangle adjacent to said one side thereof, respectively, to emit linear laser beams onto the flat panel; a camera arranged at the center of the quadrangle to photograph the laser beams reflected by the flat panel; and a frame for supporting the first to fourth laser beam oscillation units and the camera. The flat bed scan module automatically scans the shape of the flat panel to reduce measurement errors.

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Inventors:

LEE JEONG HWAN (KR)
KWON KI YOUN (KR)
RHEE SI YOUL (KR)
CHOI DOO JIN (KR)
PARK JIN HYUNG (KR)
PARK SUN KYU (KR)

Application Number:

PCT/KR2010/002886

Publication Date:

November 25, 2010

Filing Date:

May 06, 2010

Export Citation:

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Assignee:

SAMSUNG HEAVY IND (KR)
LEE JEONG HWAN (KR)
KWON KI YOUN (KR)
RHEE SI YOUL (KR)
CHOI DOO JIN (KR)
PARK JIN HYUNG (KR)
KIM JOON KIL (KR)
PARK SUN KYU (KR)

International Classes:

G01B11/00; G01B11/24

Foreign References:

US6094269A	2000-07-25
KR20070070733A	2007-07-04
KR20090027369A	2009-03-17
US20050111009A1	2005-05-26

Attorney, Agent or Firm:

EZ INTERNATIONAL PATENT & TRADEMARK LAW OFFICE (KR)
특허법인이지 (KR)

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