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Patent Searching and Data


Title:
FLOW PATH STRUCTURE AND DEVICE FOR MEASURING MEASUREMENT OBJECT LIQUID
Document Type and Number:
WIPO Patent Application WO/2017/065163
Kind Code:
A1
Abstract:
As a flow path structure readily applicable to size reduction of a measurement device into which the flow path structure is built, a flow path structure is provided which is characterized by being provided with: a substrate having a supply flow path for guiding a measurement object liquid thereinto; a separation element accommodating part for accommodating a separation element for separating a plurality of components included in the measurement object liquid guided by the supply flow path; and a detection part for guiding the measurement object liquid passing through the separation element accommodating part, the measurement object liquid being irradiated by measurement light for measuring information relating to the components; the detection part having a measurement flow path portion for guiding the measurement object liquid, an incidence portion for guiding the measurement light into the measurement flow path portion, the incidence portion being provided to an end part of the measurement flow path portion, and an emission portion for guiding the measurement light out from the measurement flow path portion, the emission portion being provided to the other end part of the measurement flow path portion.

Inventors:
SAKAI OSAMU (JP)
TAGUCHI YOSHIHIRO (JP)
SAMESHIMA KENICHIRO (JP)
SUZUKI YOSHIMUNE (JP)
Application Number:
PCT/JP2016/080226
Publication Date:
April 20, 2017
Filing Date:
October 12, 2016
Export Citation:
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Assignee:
ALPS ELECTRIC CO LTD (JP)
International Classes:
G01N30/60; G01N30/02; G01N30/74; G01N37/00
Foreign References:
JPH11142386A1999-05-28
JP2007218838A2007-08-30
JP2013529780A2013-07-22
JP2003121349A2003-04-23
JP2006292636A2006-10-26
Other References:
See also references of EP 3364186A4
Attorney, Agent or Firm:
OKUBO, Katsuyuki (JP)
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