Title:
FLOW RATE MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2011/074248
Kind Code:
A1
Abstract:
When a flow rate is greater than or equal to a reference flow rate, the reference voltage is changed to a level which can be stably measured, thereby improving the measurement accuracy when the flow rate is high. The reference flow rate and a flow rate value calculated by means of a flow rate calculation means (11) are compared by means of a flow rate determination means (14). By changing the reference voltage value which is set by means of a reference voltage setting means (13) when the calculated flow rate is greater than the reference flow rate, the zero-cross point of a reception waveform can be stably detected in an area in which the influence of the variation in the reception signal amplitude is small. Therefore, it is possible to provide a flow rate measuring device which can stably and precisely measure a flow rate even if the flow rate is high and has disturbances.
Inventors:
GOTOU HIROKAZU
WATANABE AOI
FUJII YUJI
TAKEMURA KOUICHI
NAKABAYASHI YUJI
WATANABE AOI
FUJII YUJI
TAKEMURA KOUICHI
NAKABAYASHI YUJI
Application Number:
PCT/JP2010/007260
Publication Date:
June 23, 2011
Filing Date:
December 14, 2010
Export Citation:
Assignee:
PANASONIC CORP (JP)
GOTOU HIROKAZU
WATANABE AOI
FUJII YUJI
TAKEMURA KOUICHI
NAKABAYASHI YUJI
GOTOU HIROKAZU
WATANABE AOI
FUJII YUJI
TAKEMURA KOUICHI
NAKABAYASHI YUJI
International Classes:
G01F1/66
Foreign References:
JP2003106882A | 2003-04-09 | |||
JP2004125769A | 2004-04-22 | |||
JP2003106882A | 2003-04-09 | |||
JP2009284700A | 2009-12-03 |
Other References:
See also references of EP 2515089A4
Attorney, Agent or Firm:
OGURI, Shohei et al. (JP)
Shohei Oguri (JP)
Shohei Oguri (JP)
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