FOOD QUALITY EXAMINATION DEVICE, FOOD COMPONENT EXAMINATION DEVICE, FOREIGN MATTER COMPONENT EXAMINATION DEVICE, TASTE EXAMINATION DEVICE, AND CHANGED STATE EXAMINATION DEVICE

WIPO Patent Application WO/2010/032553

A1

A food quality examination device and so forth enable examination of the quality of a food with high sensitivity using an InP photodiode which has a photosensitivity in a broadened wavelength range longer than 1.8 μm and exhibits a dark current reduced with no cooling mechanism.  The food quality examination device is characterized in that a photosensitive layer (3) has a multiple quantum well structure formed of a group III-V semiconductor, a pn junction (15) is formed by selectively diffusing an impurity element in the light receiving layer, the concentration of the impurity in the light receiving layer is less than 5×1016/cm3, and at least one wavelength of light within the water absorption band shorter than 3 μm is received to conduct an examination.

NAGAI YOUICHI (JP)
IGUCHI YASUHIRO (JP)

PCT/JP2009/063247

March 25, 2010

July 24, 2009

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SUMITOMO ELECTRIC INDUSTRIES (JP)
NAGAI YOUICHI (JP)
IGUCHI YASUHIRO (JP)

B82Y10/00; H01L31/0264; B82Y15/00; B82Y20/00; G01J1/02; G01N21/35; G01N21/359; H01L27/146; H01L31/10

JP2008153311A	2008-07-03
JP2007080920A	2007-03-29
JPS631079A	1988-01-06
JPH05160429A	1993-06-25
JP2008171885A	2008-07-24
JP2008014873A	2008-01-24
JP2007201432A	2007-08-09
JP2008205001A	2008-09-04
JPH05160426A	1993-06-25
JPH0338887A	1991-02-19

A.YAMAMOTO EL. AL.: "Optical properties of GaAs0.5Sb0.5 and In0.53Ga0.47As/GaAs0.5Sb0.5 type II single hetero-structures lattice-matched to InP substrates grown by molecular beam epitaxy", JOURNAL OF CRYSTAL GROWTH, vol. 201/202, 1999, pages 872 - 876, XP004175256

NAKATA, Motomi et al. (JP)
Nakada Motoki (JP)

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