Title:
FOREIGN-MATTER INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/057738
Kind Code:
A1
Abstract:
A foreign-matter inspection device is provided with: a conveying unit for conveying an inspected object along a conveying path; an x-ray inspection unit whereby foreign matter included in the inspected object conveyed by the conveying unit is detected via radiolucency; a DC-type metal detection whereby foreign matter included in the inspected object conveyed by the conveying unit is detected via the interaction between magnetic fields and metals; and a housing for suppressing the escape of x-rays from the x-ray inspection unit, said housing internally accommodating the x-ray inspection unit, metal detection unit, and at least part of the conveying unit. The metal detection unit is provided with a detection head positioned so as to face the transport path, the detection head including a search coil. The detection head has a cantilever structure supported at one axial-direction side of the transport path.
Inventors:
IINAGA SHINYA (JP)
Application Number:
PCT/JP2016/079138
Publication Date:
April 06, 2017
Filing Date:
September 30, 2016
Export Citation:
Assignee:
ISHIDA SEISAKUSHO (JP)
NISSIN ELECTRONICS CO LTD (JP)
NISSIN ELECTRONICS CO LTD (JP)
International Classes:
G01N23/18; G01N23/04; G01N27/72
Domestic Patent References:
| WO2005043149A1 | 2005-05-12 |
Foreign References:
| JP2006038691A | 2006-02-09 | |||
| JP2003307572A | 2003-10-31 | |||
| JPH11183407A | 1999-07-09 | |||
| JP2006337340A | 2006-12-14 | |||
| JP2008039442A | 2008-02-21 |
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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