Title:
FRAME LENGTH CONTROL DEVICE, FRAME LENGTH CONTROL METHOD AND FRAME LENGTH CONTROL PROGRAM
Document Type and Number:
WIPO Patent Application WO/2014/083665
Kind Code:
A1
Abstract:
A frame checking unit (220) checks whether or not a test frame (190) is corrupted for each test frame (190). A noise interval analysis unit (230), on the basis of results of the checking of each test frame (190), calculates noise intervals at which noise occurs. A noise property estimation unit (240), on the basis of each noise interval, generates noise property information (249) representing properties of the noise. A frame length determination unit (250), on the basis of the noise property information (249), calculates a suitable frame length for minimizing ratio of corruption of normal frames (102) caused by the noise. A frame configuration unit (280) generates normal frames (102) in a suitable frame length.
Inventors:
OKAHARA HIRONORI (JP)
Application Number:
PCT/JP2012/080990
Publication Date:
June 05, 2014
Filing Date:
November 29, 2012
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
OKAHARA HIRONORI (JP)
OKAHARA HIRONORI (JP)
International Classes:
H04L29/08
Foreign References:
| JP2001217896A | 2001-08-10 | |||
| JP2012023887A | 2012-02-02 | |||
| JP2009094995A | 2009-04-30 | |||
| JP2011232147A | 2011-11-17 | |||
| JP2008010948A | 2008-01-17 | |||
| JP2010008205A | 2010-01-14 |
Attorney, Agent or Firm:
MIZOI, Shoji et al. (JP)
Shoji Mizoi (JP)
Shoji Mizoi (JP)
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