Title:
FREQUENCY COMPONENT MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2007/132660
Kind Code:
A1
Abstract:
It is possible to provide a frequency component measuring device capable of narrowing the
range of transmission frequency of a local oscillator, preventing degradation of
the level measurement accuracy, and measuring the level of a modulation wave. The
device includes: a local oscillator (24) capable of performing sweep in a predetermined
frequency range; a mixer (22) for mixing a local oscillation signal outputted
from the local oscillator (24) and a measurement object signal to be measured
so as to subject the measurement object signal to a frequency conversion; a plurality
of intermediate-frequency filters (44, 46) for extracting components of different
intermediate frequencies from a signal outputted from the mixer (22); and an
image removal processing unit (66) for performing image removal according to
the plurality of intermediate-frequency signals separately outputted from
the intermediate-frequency filters (44, 46) corresponding to frequency sweep
operations performed by the local oscillator (24) more than once.
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Inventors:
HIRAKOSO YOHEI (JP)
Application Number:
PCT/JP2007/059033
Publication Date:
November 22, 2007
Filing Date:
April 26, 2007
Export Citation:
Assignee:
ADVANTEST CORP (JP)
HIRAKOSO YOHEI (JP)
HIRAKOSO YOHEI (JP)
International Classes:
G01R23/173; G01R23/165
Domestic Patent References:
| WO2002029426A1 | 2002-04-11 |
Foreign References:
| JPH08105922A | 1996-04-23 |
Attorney, Agent or Firm:
AMAGAI, Masahiko (3-10 Hyakunin-cho 3-chome,Shinjuku-ku, Tokyo73, JP)
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