FUNDUS ANALYSIS DEVICE AND FUNDUS ANALYSIS METHOD

Title:

FUNDUS ANALYSIS DEVICE AND FUNDUS ANALYSIS METHOD

Document Type and Number:

WIPO Patent Application WO/2011/013315

Kind Code:

A1

Abstract:

Disclosed is a technique that allows the effective detection of drusen in the fundus. A fundus analysis device (1) subjects the fundus (Ef) to OCT measurement and forms a plurality of tomographic images that respectively depict the layer structure of the fundus (Ef). Each tomographic image which is formed is stored in a storage unit (212). A layer region identifying unit (233) identifies a layer region equivalent to the pigment layer of the retina on the basis of the pixel values of pixels of each tomographic image. A curve calculation unit (234) determines the reference curve protruding in the direction of the depth of the fundus (Ef) on the basis of the shape of the layer region. A protruding region identifying unit (235) identifies, on the basis of the layer region and the reference curve, protruding regions wherein the layer region protrudes opposite to the direction of the depth of the fundus (Ef). A form information generation unit (236) generates form information relating to the forms (the number, sizes, distribution, etc.) of the protruding regions.

Inventors:

FUJIMURA TAKASHI (JP)
AOKI HIROYUKI (JP)

Application Number:

PCT/JP2010/004581

Publication Date:

February 03, 2011

Filing Date:

July 14, 2010

Export Citation:

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Assignee:

TOPCON CORP (JP)
FUJIMURA TAKASHI (JP)
AOKI HIROYUKI (JP)

International Classes:

A61B3/10; A61B3/14

Foreign References:

JP2009089792A	2009-04-30
JP2008295804A	2008-12-11
JP2008272256A	2008-11-13
JP2010094381A	2010-04-30
JP2010035607A	2010-02-18
JPH11325849A	1999-11-26
JP2002139421A	2002-05-17
JP2007024677A	2007-02-01
JP2006153838A	2006-06-15
JP2008073099A	2008-04-03
JPH09276232A	1997-10-28
JP2008295804A	2008-12-11

Other References: