GAS ANALYSIS DEVICE AND GAS ANALYSIS METHOD

Title:

GAS ANALYSIS DEVICE AND GAS ANALYSIS METHOD

Document Type and Number:

WIPO Patent Application WO/2015/033582

Kind Code:

A1

Abstract:

Provided is a gas analysis device that has a cell for accommodating a gas to be measured, a light source for selecting mid-infrared light of arbitrary wavelengths and emitting the light into the cell, and a detector for detecting mid-infrared light that has passed through the inside of the cell, and that measures two or more types of gas components included in a gas, emits mid-infrared light having wavelengths synchronized with the absorption spectra of the gas components to be measured from the light source, and determines the concentration of the gas components from the optical intensities detected by the detector, wherein a measurement integration time is set for each of the mid-infrared light wavelengths for the gas components under measurement, and the emission time of the light source, the detection time of the detector, or both are controlled according to the measurement integration times. As a result, a plurality of gas components included in a gas are measured efficiently using mid-infrared light of a plurality of wavelengths.

Inventors:

YUMOTO MASAKI
MIYAZAKI KOJI
WADA SATOSHI
OGAWA TAKAYO
IMAI SHINICHI

Application Number:

PCT/JP2014/004597

Publication Date:

March 12, 2015

Filing Date:

September 08, 2014

Export Citation:

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Assignee:

RIKEN (JP)

International Classes:

G01N21/3504

Foreign References:

JP2009222527A	2009-10-01
JPS5892843A	1983-06-02
JP2006300760A	2006-11-02
JP2006300760A	2006-11-02

Other References: