Title:
HIGH-END VOLTAGE DIFFERENTIAL SAMPLING CALIBRATION SYSTEM AND METHOD
Document Type and Number:
WIPO Patent Application WO/2024/011935
Kind Code:
A1
Abstract:
A high-end voltage differential sampling calibration system and a method, the system comprising a precision detector, a calibration controller, a differential operational amplifier, a comparator, a memory and a DAC converter. A collected voltage signal value is converted by means of the characteristics of U1 conversion output of the DAC converter to achieve a high-precision output voltage difference; the high-precision detector, the high-precision calibration controller and the differential operational amplifier are used to output voltages for comparison, and a difference value is calibrated and compensated to an output end, achieving a stable state of the output voltage. The present system improves the stability and accuracy of voltage output with high measurement precision, high efficiency and excellent stability.
Inventors:
ZHONG XING (CN)
BAO ZHIJIE (CN)
BAO ZHIJIE (CN)
Application Number:
PCT/CN2023/081501
Publication Date:
January 18, 2024
Filing Date:
March 15, 2023
Export Citation:
Assignee:
MACROTEST SEMICONDUCTOR TECH CO LTD (CN)
International Classes:
G01R35/00; G01R19/25
Foreign References:
CN114895231A | 2022-08-12 | |||
CN111766435A | 2020-10-13 | |||
CN103884900A | 2014-06-25 | |||
CN212463048U | 2021-02-02 | |||
CN88100509A | 1988-08-10 | |||
US20150070023A1 | 2015-03-12 | |||
US6515464B1 | 2003-02-04 |
Attorney, Agent or Firm:
NANJING XINZHONGHE PATENT AGENCY (GENERAL PARTNERSHIP) (CN)
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