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Title:
IC INSPECTION SOCKET
Document Type and Number:
WIPO Patent Application WO/2022/202246
Kind Code:
A1
Abstract:
An IC inspection socket comprising: a pin block having a plurality of contact probes; a floating plate for guiding an IC package to be inspected; and a heat-generating body for heating the IC package. The heat-generating body is in contact with the IC package.

Inventors:
TAKEI DAIGO (JP)
TAKEUCHI KAZUMA (JP)
Application Number:
PCT/JP2022/009669
Publication Date:
September 29, 2022
Filing Date:
March 07, 2022
Export Citation:
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Assignee:
YOKOWO SEISAKUSHO KK (JP)
International Classes:
H01R33/76
Foreign References:
JP2004327264A2004-11-18
JP2020134232A2020-08-31
US10466273B12019-11-05
JP2020017455A2020-01-30
Attorney, Agent or Firm:
KURODA Yasushi et al. (JP)
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