Title:
IMAGE ANALYSIS DEVICE, IMAGE ANALYSIS METHOD, AND IMAGE ANALYSIS PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/168042
Kind Code:
A1
Abstract:
The image analysis device according to one aspect of the present invention repetitively acquires captured images showing an object to be detected, includes an image acquisition unit for repetitively acquiring captured images showing an object to be detected, detects a first region which is presumed to show the object in a state of not being masked by a masking object within a captured image that has been acquired, detects a second region which is presumed to show the object in a state of being masked by a masking object within the captured image that has been acquired, and determines whether or not the object is being masked by a masking object on the basis of a result of detecting of the first and the second regions and on the basis of a result of determination performed with respect to a captured image that has been previously acquired.
Inventors:
YABUUCHI TOMOHIRO (JP)
AIZAWA TOMOYOSHI (JP)
KINOSHITA KOICHI (JP)
HYUGA TADASHI (JP)
AOI HATSUMI (JP)
UETANI MEI (JP)
AIZAWA TOMOYOSHI (JP)
KINOSHITA KOICHI (JP)
HYUGA TADASHI (JP)
AOI HATSUMI (JP)
UETANI MEI (JP)
Application Number:
PCT/JP2017/036280
Publication Date:
September 20, 2018
Filing Date:
October 05, 2017
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G06T7/00
Foreign References:
| JP2012048675A | 2012-03-08 | |||
| JP2008269182A | 2008-11-06 | |||
| JP2012238057A | 2012-12-06 | |||
| JP2011002882A | 2011-01-06 | |||
| JP2015213537A | 2015-12-03 | |||
| JP2008009849A | 2008-01-17 | |||
| JP2016040705A | 2016-03-24 | |||
| JP2007287024A | 2007-11-01 | |||
| JP2010160640A | 2010-07-22 |
Attorney, Agent or Firm:
TACHIBANA, Kenji et al. (JP)
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