Title:
IMAGE ANALYSIS METHOD, IMAGE ANALYSIS DEVICE, AND IMAGE ANALYSIS PROGRAM
Document Type and Number:
WIPO Patent Application WO/2015/133526
Kind Code:
A1
Abstract:
Provided is an image analysis method that is able to determine the position corresponding to the center of a circle in an image capturing the circle. The image analysis method, which determines a point (c0) corresponding to the center of a circle (C, D) in an image capturing the circle (C, D) on a plane, contains a processing step for determining the position of a first corresponding point (c0) on the image on the basis of the relationship between the compound ratio of a first point (C0, D0), which is the center of the circle (C, D), a second point (E, F) and third point (E', F') at which a center line passing through the first point (C0, D0) intersects the circle (C, D), and a fourth point (A) at which the center line and a line (H) at infinity intersect, and the compound radio of first through fourth corresponding points (c0, e, f, e', f') on the image and corresponding to the first through fourth points.
Inventors:
CHEN QIAN (JP)
WU HAIYUAN (JP)
WU HAIYUAN (JP)
Application Number:
PCT/JP2015/056374
Publication Date:
September 11, 2015
Filing Date:
March 04, 2015
Export Citation:
Assignee:
WAKAYAMA UNIVERSITY (JP)
International Classes:
G06T7/60
Domestic Patent References:
| WO2008078744A1 | 2008-07-03 |
Foreign References:
| JP2008032551A | 2008-02-14 | |||
| JPH09212643A | 1997-08-15 |
Attorney, Agent or Firm:
SunCrest Patent and Trademark Attorneys (JP)
Patent business corporation Sun Crest international patent firm (JP)
Patent business corporation Sun Crest international patent firm (JP)
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