Title:
IMPEDANCE MEASUREMENT SYSTEM AND METHOD
Document Type and Number:
WIPO Patent Application WO/2023/139871
Kind Code:
A1
Abstract:
The present invention addresses the problem of providing an impedance measurement system and method capable of suppressing the effect of noise in the vicinity of a measurement frequency due to interference from a plurality of impedance measurement devices, and performing highly accurate impedance measurements. The above problem is solved by providing an impedance measurement system equipped with a first impedance measurement device (1), a second impedance measurement device (2), and computation units (40, 41) for determining the impedance of a measurement subject on the basis of the average of the magnitude of a filtered signal over a measurement period, wherein: the phase of a measurement signal of the second impedance measurement device is changed such that a modulation signal and the measurement signal of the second impedance measurement device are alternately in the same phase or opposite phases for each first inversion period of 1/2n (n is a natural number) of the measurement period; and the computation unit of the second impedance measurement device inverts the sign of the magnitude of the filtered signal generated when the measurement signal and the modulation signal are in opposite phases, and then calculates the average.
Inventors:
HANEDA KAZUAKI (JP)
YOKOYAMA TAKAHIRO (JP)
YOKOYAMA TAKAHIRO (JP)
Application Number:
PCT/JP2022/039990
Publication Date:
July 27, 2023
Filing Date:
October 26, 2022
Export Citation:
Assignee:
HIOKI ELECTRIC WORKS (JP)
International Classes:
G01R27/02
Foreign References:
| JP2019086474A | 2019-06-06 | |||
| JP2018036205A | 2018-03-08 | |||
| JP2001281280A | 2001-10-10 | |||
| JP2010272991A | 2010-12-02 | |||
| JPH0431773A | 1992-02-03 | |||
| US20170336469A1 | 2017-11-23 |
Attorney, Agent or Firm:
EINSEL Felix-Reinhard et al. (JP)
Download PDF: