Title:
IMPEDANCE MEASUREMENT DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/2023/139870
Kind Code:
A1
Abstract:
Provided is an impedance measurement device which can suppress the influence of noise near a measurement frequency and which enables measurement with high accuracy. The above problem can be solved by an impedance measurement device (1), or the like, comprising: a signal generation unit (30) that generates a first reference signal and a second reference signal obtained by inverting the phase of the first reference signal for every predetermined inversion period; a measurement signal supply unit (10) that generates a measurement signal on the basis of the second reference signal and that supplies the same to a measurement target; a measurement unit (20) that synchronously detects a signal generated in the measurement target by the measurement signal, by using modulation signals generated on the basis of the first reference signal, and then generates filtered signals having undergone low-pass filtration; and a calculation unit (40) that calculates impedance of the measurement target on the basis of an added average of the magnitude of a filtered signal at the time when the first and second reference signals are in the same phase and the magnitude of a filtered signal having undergone sign inversion at the time when the first and second reference signals are in negative phases.
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Inventors:
HANEDA KAZUAKI (JP)
YOKOYAMA TAKAHIRO (JP)
YOKOYAMA TAKAHIRO (JP)
Application Number:
PCT/JP2022/039989
Publication Date:
July 27, 2023
Filing Date:
October 26, 2022
Export Citation:
Assignee:
HIOKI ELECTRIC WORKS (JP)
International Classes:
G01R27/02; G01R27/08
Domestic Patent References:
| WO2020079888A1 | 2020-04-23 |
Foreign References:
| JP2015014469A | 2015-01-22 | |||
| JP3930586B2 | 2007-06-13 | |||
| JP2001074793A | 2001-03-23 | |||
| JP2011038969A | 2011-02-24 |
Attorney, Agent or Firm:
EINSEL Felix-Reinhard et al. (JP)
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