Title:
INSPECTION ASSISTANCE DEVICE AND METHOD FOR STRUCTURE
Document Type and Number:
WIPO Patent Application WO/2020/116279
Kind Code:
A1
Abstract:
Provided are an inspection assistance device and method for a structure, the device and method enabling automatic detection of an event caused by damage and the damage causing the event and enabling reduction in burden of inspection of a structure. This device is provided with: an image acquisition unit which acquires an image captured of a structure to be inspected; a detector (52) which has undergone machine learning and which detects damage in a structure and an event induced by the damage by using the image acquired by the image acquisition unit as an input image (34); and an output unit (60) which outputs a detection result by the detector (52).
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Inventors:
MATSUMOTO KAZUMA (JP)
Application Number:
PCT/JP2019/046364
Publication Date:
June 11, 2020
Filing Date:
November 27, 2019
Export Citation:
Assignee:
FUJIFILM CORP (JP)
International Classes:
E04G23/00; G01N21/88
Domestic Patent References:
| WO2018037689A1 | 2018-03-01 |
Foreign References:
| JP2016065809A | 2016-04-28 | |||
| JP2009234872A | 2009-10-15 | |||
| JP2018185146A | 2018-11-22 | |||
| JP2016142601A | 2016-08-08 | |||
| JP2006338654A | 2006-12-14 | |||
| JPH09119900A | 1997-05-06 |
Attorney, Agent or Firm:
MATSUURA, Kenzo (JP)
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