Title:
INSPECTION DEVICE, LASER PROCESSING DEVICE, AND LASER PROCESSING INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2016/129370
Kind Code:
A1
Abstract:
An inspection device that is provided with: a measurement unit that, during laser processing, measures the quantity of light that is emitted from a processed member; and a determination unit that determines the processing state of the processed member from the quantity of light measured by the measurement unit. The determination unit determines the amount that the processed member has been processed by comparing a predetermined reference quantity of light with the measured quantity of light measured by the measurement unit.
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Inventors:
NISHIKAWA KAZUYOSHI (JP)
Application Number:
PCT/JP2016/052011
Publication Date:
August 18, 2016
Filing Date:
January 25, 2016
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
B23K26/00; B29C59/16
Foreign References:
| JPH0655283A | 1994-03-01 | |||
| JP2003519933A | 2003-06-24 | |||
| JP2014004801A | 2014-01-16 | |||
| JP2013154366A | 2013-08-15 |
Attorney, Agent or Firm:
ARC PATENT ATTORNEYS' OFFICE (JP)
Patent business corporation ARC PATENT ATTORNEYS' OFFICE (JP)
Patent business corporation ARC PATENT ATTORNEYS' OFFICE (JP)
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