Title:
INSPECTION JIG AND INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/004988
Kind Code:
A1
Abstract:
Provided are an inspection jig and an inspection device with which inductance generated in a wiring path for carrying out an electrical inspection can easily be reduced. The inspection jig 3 comprises a first probe P1 for making contact with a first terminal T1 of an inspection subject DUT, a second probe P2 for making contact with a second terminal T2 of the inspection subject DUT, and a cable 7 including a flat first conductor 71 for supplying current to the first probe P1 and a flat second conductor 72 for supplying current to the second probe P2, wherein the first conductor 71 and the second conductor 72 are arranged facing one another with an insulator 73 therebetween, and the first conductor 71 and the second conductor 72 are arranged so as to achieve the maximum overlap between the first conductor 71 and the second conductor 72 when viewed from the direction in which said conductors face one another.
Inventors:
KASAI JUN (JP)
YAMASHITA MUNEHIRO (JP)
HATTORI MITSUKI (JP)
TSUMURA KOHEI (JP)
YAMASHITA MUNEHIRO (JP)
HATTORI MITSUKI (JP)
TSUMURA KOHEI (JP)
Application Number:
PCT/JP2023/023736
Publication Date:
January 04, 2024
Filing Date:
June 27, 2023
Export Citation:
Assignee:
NIDEC ADVANCE TECH CORPORATION (JP)
International Classes:
G01R1/06
Foreign References:
| JP2012078174A | 2012-04-19 | |||
| JPS5875490U | 1983-05-21 | |||
| JP2017055557A | 2017-03-16 | |||
| JP2005049163A | 2005-02-24 | |||
| JP2001099889A | 2001-04-13 | |||
| CN102012440A | 2011-04-13 | |||
| CN106802386A | 2017-06-06 | |||
| US20200249273A1 | 2020-08-06 |
Attorney, Agent or Firm:
KAJIHARA Kei (JP)
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