Title:
INSPECTION SYSTEM, INSPECTION METHOD, MODEL GENERATION SYSTEM, DETERMINATION SYSTEM, MODEL GENERATION METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2022/264644
Kind Code:
A1
Abstract:
The invention addresses the problem of improving the accuracy of identifying a material to be inspected in an inspection system and an inspection method using an inspection target image obtained by imaging an inspection target and the background. This inspection system (100) comprises an inspection image acquisition unit (31), a spectrum correction unit (32), a spectrum determination unit (33), and a result output unit (40). The inspection image acquisition unit (31) acquires an inspection target image. The inspection target image is obtained by imaging a subject including an inspection target and the background in 4 or more wavelength regions. The spectrum correction unit (32) generates a second spectrum by correcting a first spectrum on the basis of the spectrum of an image of the background. The first spectrum is the spectrum of the image of the inspection target in the inspection target image. The spectrum determination unit (33) determines, on the basis of the second spectrum, whether the inspection target is a first material.
More Like This:
Inventors:
KATO TAKAHIRO
KAWAGUCHI YOKO
AIKAWA HISASHI
KAWAGUCHI YOKO
AIKAWA HISASHI
Application Number:
PCT/JP2022/016280
Publication Date:
December 22, 2022
Filing Date:
March 30, 2022
Export Citation:
Assignee:
PANASONIC IP MAN CO LTD (JP)
International Classes:
G01N21/27
Foreign References:
| JP2017090130A | 2017-05-25 | |||
| JP2016217899A | 2016-12-22 | |||
| JP2021058361A | 2021-04-15 | |||
| JP2003185588A | 2003-07-03 | |||
| JP2018066608A | 2018-04-26 |
Attorney, Agent or Firm:
HOKUTO PATENT ATTORNEYS OFFICE (JP)
Download PDF:
Previous Patent: NON-BAKED PENCIL LEAD AND METHOD FOR MANUFACTURING SAME
Next Patent: METHOD FOR ANALYZING MODIFIED NUCLEOSIDE
Next Patent: METHOD FOR ANALYZING MODIFIED NUCLEOSIDE