Title:
INSTRUCTION TEST METHOD AND DEVICE, TEST PLATFORM, AND READABLE STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2023/226061
Kind Code:
A1
Abstract:
Embodiments of the present disclosure provide an instruction test method and device, a test platform, and a readable storage medium, and relate to the technical field of semiconductors. The method comprises: when a target instruction to be sent to a memory is present on the test platform, determining the duration of a dummy instruction according to a minimum time interval between the target instruction and each historical instruction and a time interval between a sending moment of each historical instruction and a current moment, and sending the target instruction to the memory after the dummy instruction. Manual participation may not be required, and time intervals between instructions are efficiently determined, so that each instruction is accurately sent.
Inventors:
LI YU (CN)
SHI TENG (CN)
SHI TENG (CN)
Application Number:
PCT/CN2022/096076
Publication Date:
November 30, 2023
Filing Date:
May 30, 2022
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G11C29/56
Domestic Patent References:
| WO2016113223A1 | 2016-07-21 |
Foreign References:
| CN114297103A | 2022-04-08 | |||
| CN108139994A | 2018-06-08 | |||
| CN101403958A | 2009-04-08 | |||
| US20210278999A1 | 2021-09-09 |
Attorney, Agent or Firm:
LEADER PATENT & TRADEMARK FIRM (CN)
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