LIGHT DETECTION DEVICE AND ELECTRONIC APPARATUS

WIPO Patent Application WO/2023/090053

A1

Provided is a light detection device in which degradation of element characteristics is suppressed. This light detection device comprises: a first semiconductor layer having one surface that is a first surface and another surface that is a second surface, and including a pixel region in which a plurality of photoelectric conversion portions capable of performing photoelectric conversion with respect to incident light entering from the second surface are disposed in a matrix, and a peripheral region provided outside the pixel region so as to surround the pixel region; a laminate overlaid on the second surface of the first semiconductor layer, and including a fixed charge film, an insulating film, a land provided in the insulating film and disposed in a position overlapping the peripheral region in plan view, and a first wire connected to the land; a first wiring layer overlaid on the first surface of the first semiconductor layer and having a second wire; and a through conductor extending through the peripheral region in a thickness direction, and having one end connected to the first wire and the other end connected to the second wire. The fixed charge film is overlaid on the first semiconductor layer in the peripheral region via a first insulating film that is a part of the insulating film.

MORI HIROYUKI (JP)

PCT/JP2022/039349

May 25, 2023

October 21, 2022

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SONY SEMICONDUCTOR SOLUTIONS CORP (JP)

H01L27/146; H01L21/3205; H01L21/768; H01L23/522; H04N25/70

US20200144320A1	2020-05-07
JP2008306154A	2008-12-18
JP2016163011A	2016-09-05
JP2012191005A	2012-10-04

TANAKA Hidetetsu et al. (JP)

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