Title:
MAGNETIC FINE PARTICLE IMAGING DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/220113
Kind Code:
A1
Abstract:
A first measuring coil pair (3) is arranged so as to sandwich a magnetic fine particle (1). A second measuring coil pair (4) is arranged so as to sandwich the magnetic fine particle (1) and the first measuring coil pair (3). An alternating current magnetic field applying coil pair (5) is arranged so as to sandwich the magnetic fine particle (1), the first measuring coil pair (3), and the second measuring coil pair (4). A measuring instrument outputs a signal representing a difference between a signal measured by the first measuring coil pair (3) and a signal measured by the second measuring coil pair (4).
Inventors:
NOMURA KOTA (JP)
MATSUDA TETSUYA (JP)
YAMAUCHI KAZUKI (JP)
WASHINO MASAOMI (JP)
MATSUDA TETSUYA (JP)
YAMAUCHI KAZUKI (JP)
WASHINO MASAOMI (JP)
Application Number:
PCT/JP2022/015583
Publication Date:
October 20, 2022
Filing Date:
March 29, 2022
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01R33/02; A61B5/0515; G01N27/72; G01R33/10
Foreign References:
| JP6844075B1 | 2021-03-17 | |||
| JP2008519268A | 2008-06-05 | |||
| JPH05232202A | 1993-09-07 | |||
| JP2010172410A | 2010-08-12 | |||
| JP2008307254A | 2008-12-25 | |||
| US20170067971A1 | 2017-03-09 |
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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