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Patent Searching and Data


Title:
OPTICAL MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/220112
Kind Code:
A1
Abstract:
This optical measurement device is configured from a polarized light radiating unit 10 that irradiates an object Ob with radiated light having controlled polarization, and a polarization imaging unit 20 that images the polarization state of a measured light occurring as a result of scattering, reflection, or absorption of the radiated light by the object Ob, calculates all or a portion of the Stokes parameters of the measured light, and measures a change in a polarized component occurring between the radiated light and the measured light due to the object Ob. The radiated light having a controlled polarization state is radiated onto the object, and so it is possible to acquire object information that was difficult to measure if an object was irradiated with natural light, that is to say, unpolarized radiated light, and it is also possible to suppress noise and contrast reduction caused when radiated light having an unstable polarization state is radiated onto the object and the polarization is measured.

Inventors:
SAKAMOTO MORITSUGU (JP)
ONO HIROSHI (JP)
NODA KOHEI (JP)
TANAKA MASAYUKI (JP)
Application Number:
PCT/JP2022/015582
Publication Date:
October 20, 2022
Filing Date:
March 29, 2022
Export Citation:
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Assignee:
NATIONAL UNIV CORPORATION NAGAOKA UNIV OF TECHNOLOGY (JP)
OPT GATE CO LTD (JP)
International Classes:
G01N21/21; G01J4/04
Domestic Patent References:
WO2019147828A12019-08-01
Foreign References:
JP2019052857A2019-04-04
JP2020204539A2020-12-24
CN111208067A2020-05-29
JP2019100862A2019-06-24
Other References:
MORITSUGU SAKAMOTO: "C-3-13 Generation and detection of optical vortices and vector beams using liquid crystal polarization gratings", PROCEEDINGS OF THE 2019 GENERAL CONFERENCE OF THE INSTITUTE OF ELECTRONICS, INFORMATION AND COMMUNICATION ENGINEERS ELECTRONICS 1; 2019.03.19-22, 1 January 2019 (2019-01-01) - 22 March 2019 (2019-03-22), JP, pages 124, XP009540401
Attorney, Agent or Firm:
HIBIYA Yohei et al. (JP)
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