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Title:
MAGNETIZATION ANALYSIS METHOD, MAGNETIZATION ANALYSIS DEVICE, AND COMPUTER PROGRAM
Document Type and Number:
WIPO Patent Application WO/2008/053921
Kind Code:
A1
Abstract:
It is possible to perform accurate magnetization analysis by considering the magnetic state of an incomplete magnetic region. A magnetization analysis device performs magnetization analysis by using a magnetizer parameter associated with a magnetizer and a magnet parameter associated with a magnet material so as to calculate a magnetization magnetic field applied to respective portions of the magnet material (S17), calculates a recoil ratio permeability and a coercive force as region parameters associated with an incompletely magnetized region of a permanent magnet as an analysis object for the respective portions according to the calculation result of the magnetized magnetic field and the demagnetization curve associated with the incompletely magnetized region actually measured in advance (S18), and performs a magnetic field analysis by using the calculation result of the region parameter so as to calculate a state parameter indicating the magnetized state of the permanent magnet as an analysis object (S19).

Inventors:
SHIMAMURA HIDENARI
NATSUMEDA MITSUTOSHI
Application Number:
PCT/JP2007/071232
Publication Date:
May 08, 2008
Filing Date:
October 31, 2007
Export Citation:
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Assignee:
HITACHI METALS LTD (JP)
SHIMAMURA HIDENARI
NATSUMEDA MITSUTOSHI
International Classes:
G01R33/12; G06F17/50; H01F13/00
Foreign References:
JP2004127056A2004-04-22
JP2000346919A2000-12-15
JP2002329624A2002-11-15
Other References:
"Kaitenki no Virtual Engineering no Tameno Denjikai Kaiseki Gijutsu", TECHNICAL REPORT OF THE INSTITUTE OF ELECTRICAL ENGINEERS OF JAPAN, THE INSTITUTE OF ELECTRICAL ENGINEERS OF JAPAN, no. 776, 15 March 2000 (2000-03-15), XP008105850
See also references of EP 2098880A4
Attorney, Agent or Firm:
KOHNO, Takao (4-3 Tsuriganecho 2-chome,Chuo-ku, Osaka-sh, Osaka 35, JP)
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