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Patent Searching and Data


Title:
MASS SPECTROMETRY DATA PROCESSING METHOD, MASS SPECTROMETRY DATA PROCESSING DEVICE, AND MASS SPECTROMETRY DATA PROCESSING PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/017559
Kind Code:
A1
Abstract:
In order to provide a mass spectrometry data processing method, a mass spectrometry data processing device, and a mass spectrometry data processing program with which it is possible to reduce the occurrence of false positives, the present invention is characterized by including: an acquisition step for acquiring a sample spectrum, which is the mass spectrum of a sample; an extraction step for extracting a maximum-intensity-peak position of the sample spectrum; a search step for searching a database for a mass spectrum in which a peak position identical to the maximum-intensity-peak position has the maximum intensity, said mass spectrum being searched as a candidate spectrum; a setting step for setting a peak position other than the maximum-intensity-peak position of the candidate spectrum as a peak position to be analyzed; a calculation step for calculating an evaluation value for the candidate spectrum on the basis of the intensity at the peak position to be analyzed in the sample spectrum; and an determination step for determining, by using the evaluation value, whether a substance corresponding to the candidate spectrum is to be employed as a candidate substance.

Inventors:
SHISHIKA TSUKASA (JP)
YOSHIOKA SHINJI (JP)
YOSHIE MASAKI (JP)
Application Number:
PCT/JP2021/029500
Publication Date:
February 16, 2023
Filing Date:
August 10, 2021
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N27/62
Domestic Patent References:
WO2018173223A12018-09-27
Foreign References:
JP2011209062A2011-10-20
JP2001249114A2001-09-14
JP2017227542A2017-12-28
US20210062257A12021-03-04
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
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