Title:
MATERIAL IDENTIFICATION METHOD AND APPARATUS BASED ON ARTIFICIAL INTELLIGENCE ATOMIC FORCE MICROSCOPE
Document Type and Number:
WIPO Patent Application WO/2023/125111
Kind Code:
A1
Abstract:
Disclosed in embodiments of the present invention are a material identification method and apparatus based on an artificial intelligence atomic force microscope. The method comprises: obtaining a microscope scanning image; inputting the microscope scanning image into a pre-trained material identification model to obtain a classification result output by an image classification model, wherein the material identification model is obtained by training based on simulation sample images; and determining a target material corresponding to the microscope scanning image according to the classification result. The embodiments of the present invention provide a material identification model which has a simple structure and a wide applicability, thereby improving material identification efficiency and accuracy.
Inventors:
HUANG BOYUAN (CN)
TAN ZHOUYU (CN)
ZHU QINGFENG (CN)
LI JIANGYU (CN)
TAN ZHOUYU (CN)
ZHU QINGFENG (CN)
LI JIANGYU (CN)
Application Number:
PCT/CN2022/140068
Publication Date:
July 06, 2023
Filing Date:
December 19, 2022
Export Citation:
Assignee:
SHENZHEN INST OF ADV TECH CAS (CN)
International Classes:
G06N3/04; G06T7/00; G06N3/08; G06V10/44; G06V10/764; G06V10/82
Foreign References:
| CN111931817A | 2020-11-13 | |||
| CN113092824A | 2021-07-09 | |||
| CN101191773A | 2008-06-04 | |||
| CN111366753A | 2020-07-03 | |||
| US20210033549A1 | 2021-02-04 |
Attorney, Agent or Firm:
BEIJING ZHONG XUN TONG DA INTELLECTUAL PROPERTY AGENCY CO., LTD. (CN)
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