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Patent Searching and Data


Title:
MATERIAL TO BE MEASURED FOR STRESS ANALYSIS, COATING LIQUID FOR FORMING COATING FILM LAYER ON THE MATERIAL TO BE MEASURED, AND STRESS-INDUCED LUMINESCENT STRUCTURE
Document Type and Number:
WIPO Patent Application WO/2007/015532
Kind Code:
A1
Abstract:
On the surface of a material to be measured for stress analysis which has a stress-induced luminescent material layer formed thereon, a distortion energy is transmitted from a base material of a stress-induced luminescent material to the stress-induced luminescent material with high efficiency. The material to be measured for stress analysis has, formed on its surface, a coating film layer, which emits light upon exposure to a change in distortion energy. The coating film layer is formed of a synthetic resin layer containing stress-induced luminescent particles, and the modulus of elasticity of a base material is not less than 1.0 GPa. The thickness of the coating film layer is preferably 1 μm to 500 μm.

Inventors:
XU CHAO-NAN
IMAI YUSUKE
TERASAKI NAO
ADACHI YOSHIO
YAMADA HIROSHI
NISHIKUBO KEIKO
Application Number:
PCT/JP2006/315335
Publication Date:
February 08, 2007
Filing Date:
August 02, 2006
Export Citation:
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Assignee:
NAT INST OF ADVANCED IND SCIEN (JP)
XU CHAO-NAN
IMAI YUSUKE
TERASAKI NAO
ADACHI YOSHIO
YAMADA HIROSHI
NISHIKUBO KEIKO
International Classes:
G01L1/00; C09D7/12; C09D201/00
Foreign References:
JP2001215157A2001-08-10
JP2003262558A2003-09-19
JP2004170308A2004-06-17
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK (2-6 Tenjinbashi 2-chome Kita, Kita-k, Osaka-shi Osaka 41, JP)
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