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Patent Searching and Data


Title:
MEASUREMENT DEVICE AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2020/066828
Kind Code:
A1
Abstract:
This measurement device comprises: an electric field generation unit for generating an AC electric field, an electric field detection unit that is disposed at a distance from the electric field generation unit so as to oppose the same and is for detecting the AC electric field generated by the electric field generation unit, a thickness gauge for measuring the thickness of an object of measurement without touching the same, and a processing unit for deriving a calibration curve indicating the relationship between relative permittivity and the intensity of the AC electric field. The object of measurement can be inserted between the electric field generation unit and electric field detection unit. The electric field detection unit detects the intensity of the AC electric field that is attenuated by the object of measurement. The processing unit calculates the relative permittivity of the object of measurement on the basis of the intensity of the detected AC electric field, the measured thickness, and the derived calibration curve.

Inventors:
KATSUYAMA JUN (JP)
MATSUMOTO YOSHINORI (JP)
SHINAGAWA MITSURU (JP)
Application Number:
PCT/JP2019/036732
Publication Date:
April 02, 2020
Filing Date:
September 19, 2019
Export Citation:
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Assignee:
YOKOGAWA ELECTRIC CORP (JP)
UNIV HOSEI (JP)
International Classes:
G01N27/00; G01R27/26; G01R29/12
Foreign References:
JP2008145387A2008-06-26
JP2009229423A2009-10-08
JP2001099802A2001-04-13
JPH06331670A1994-12-02
JPS61182582A1986-08-15
JP2000162158A2000-06-16
EP0547968A11993-06-23
JP2018180874A2018-11-15
JP3204852B22001-09-04
JP5295047B22013-09-18
Other References:
RYO SAITO: "Graduate School of Science and Engineering, Departmental Bulletin Paper", vol. 58, March 2017, HOSEI UNIVERSITY, article "CALIBRATION TECHNOLOGY OF ORGANIC PHOTOVOLTAIC CELL VOLTAGE USING ELECTROOPTIC PROBE"
Attorney, Agent or Firm:
TANAI Sumio et al. (JP)
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