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Patent Searching and Data


Title:
MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/136831
Kind Code:
A1
Abstract:
This measurement device has: a distortion calculation unit that calculates distortion amounts in a plurality of small areas in a visible light image; a signal acquisition unit that acquires predetermined signals at locations corresponding to the small areas; and an area-by-area lock-in processing unit that, by using the distortion amounts in the small areas, executes a lock-in process for eliminating noises of the predetermined signals at the locations corresponding to the small areas.

Inventors:
TAKADA JUN (JP)
Application Number:
PCT/JP2018/048257
Publication Date:
July 02, 2020
Filing Date:
December 27, 2018
Export Citation:
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Assignee:
NEC CORP (JP)
International Classes:
G01N25/72; G01J5/48; G01N21/88
Foreign References:
JP2008232998A2008-10-02
JP2004347585A2004-12-09
JP2007163390A2007-06-28
US20080310476A12008-12-18
US20120062751A12012-03-15
Other References:
DEMIZU, AKIRA ET AL.: "Fundamental study on improvement in strain measurement accuracy of digital image correlation method", JOURNAL OF JAPAN SOCIETY OF CIVIL ENGINEERS, SER. A2 (APPLIED MECHANICS (AM), vol. 68, no. 2, 2012, pages I_683 - I_690, XP055721883
NISHIMURA, TAKASHI ET AL.: "Fatigue crack detection in steel structures by self-reference lock-in thermography", THE JAPAN SOCIETY OF MECHANICAL ENGINEERS [NO. 05-9] M & M 2005 PROCEEDINGS OF THE ANNUAL MEETING OF THE JSME/MMD, 3 November 2005 (2005-11-03), pages 637 - 638
Attorney, Agent or Firm:
BABA, Motohiro et al. (JP)
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