Title:
MEASURING DEVICE AND MEASURING METHOD FOR MEASURING PROPERTIES OF A SUBJECT TO BE MEASURED
Document Type and Number:
WIPO Patent Application WO/2011/048992
Kind Code:
A1
Abstract:
Disclosed is a measuring device that retains a subject in a periodic structure, projects electromagnetic waves at the periodic structure (1), detects the electromagnetic waves that penetrate the periodic structure (1), and measures the properties of the subject in accordance with changes in either the frequency properties or the phase properties of the electromagnetic waves that are dispersed upon the periodic structure (1) in response to the presence of the subject. The periodic structure (1) is formed from a first structural part (11) and a second structural part (12), which are positioned on opposite sides of a gap portion (2) wherein the subject is placed, and which have a complex dielectric constant that changes periodically.
Inventors:
TAKIGAWA KAZUHIRO (JP)
KONDO TAKASHI (JP)
KAMBA SEIJI (JP)
MATSUMOTO HARUO (JP)
KONDO TAKASHI (JP)
KAMBA SEIJI (JP)
MATSUMOTO HARUO (JP)
Application Number:
PCT/JP2010/067965
Publication Date:
April 28, 2011
Filing Date:
October 13, 2010
Export Citation:
Assignee:
MURATA MANUFACTURING CO (JP)
TAKIGAWA KAZUHIRO (JP)
KONDO TAKASHI (JP)
KAMBA SEIJI (JP)
MATSUMOTO HARUO (JP)
TAKIGAWA KAZUHIRO (JP)
KONDO TAKASHI (JP)
KAMBA SEIJI (JP)
MATSUMOTO HARUO (JP)
International Classes:
G01N21/01; G01N21/35; G01N21/3577; G01N21/3586
Foreign References:
| JP2006234692A | 2006-09-07 | |||
| JP2007010366A | 2007-01-18 | |||
| JP2007263891A | 2007-10-11 | |||
| JP2010210991A | 2010-09-24 |
Attorney, Agent or Firm:
Fukami Patent Office, p. c. (JP)
Patent business corporation Fukami patent firm (JP)
Patent business corporation Fukami patent firm (JP)
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