Title:
MEASURING METHOD OF CHARACTERISTIC OF OBJECT TO BE MEASURED, AND SENSING DEVICE USED IN SAME
Document Type and Number:
WIPO Patent Application WO/2011/125355
Kind Code:
A1
Abstract:
Disclosed is measuring method of a characteristic of an object to be measured, that includes a step for measuring the characteristic of the object to be measured based on fluctuations of frequency characteristics. The object to be measured is bonded via host molecules to the sensing device that includes host molecules that bond to the object to be measured, and a substrate with the immobilized host molecules, and electromagnetic waves of a specific frequency are radiated onto the sensing device bonded with the object to be measured. Then, frequency characteristics of transmitted light or reflected light are measured. The measuring method is characterized in that absorbance per unit amount in a specific frequency of the host molecules is smaller than the object to be measured.
Inventors:
TANAKA KOJI (JP)
KAMBA SEIJI (JP)
KONDO TAKASHI (JP)
TAKIGAWA KAZUHIRO (JP)
MIURA YOSHIKO (JP)
KAMBA SEIJI (JP)
KONDO TAKASHI (JP)
TAKIGAWA KAZUHIRO (JP)
MIURA YOSHIKO (JP)
Application Number:
PCT/JP2011/050963
Publication Date:
October 13, 2011
Filing Date:
January 20, 2011
Export Citation:
Assignee:
MURATA MANUFACTURING CO (JP)
TANAKA KOJI (JP)
KAMBA SEIJI (JP)
KONDO TAKASHI (JP)
TAKIGAWA KAZUHIRO (JP)
MIURA YOSHIKO (JP)
TANAKA KOJI (JP)
KAMBA SEIJI (JP)
KONDO TAKASHI (JP)
TAKIGAWA KAZUHIRO (JP)
MIURA YOSHIKO (JP)
International Classes:
G01N21/35
Domestic Patent References:
| WO2008093647A1 | 2008-08-07 |
Foreign References:
| JP2006125860A | 2006-05-18 |
Attorney, Agent or Firm:
Fukami Patent Office, p. c. (JP)
Patent business corporation Fukami patent firm (JP)
Patent business corporation Fukami patent firm (JP)
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