Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
MEMORY CHIP EVALUATION METHOD AND APPARATUS, MEMORY CHIP ACCESS METHOD AND APPARATUS, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2023/240767
Kind Code:
A1
Abstract:
Provided in the present disclosure are a memory chip evaluation method and apparatus, a memory chip access method and apparatus, and a storage medium. The evaluation method comprises: testing a preset number of memory chips under test; compiling statistics on test results on the basis of banks of the memory chips; and determining a level of reliability of each bank in the memory chips according to the test results.

Inventors:
LIU JIANBIN (CN)
MA MAOSONG (CN)
Application Number:
PCT/CN2022/110233
Publication Date:
December 21, 2023
Filing Date:
August 04, 2022
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G11C29/56; G11C11/408
Foreign References:
US8601313B12013-12-03
US20100017650A12010-01-21
CN103577334A2014-02-12
JPH1185707A1999-03-30
US8880801B12014-11-04
US20080126850A12008-05-29
Attorney, Agent or Firm:
BOXIN CHINA INTELLECTUAL PROPERTY (CN)
Download PDF:
View/Download PDF      PDF Help



 
Previous Patent: OVERHEAD RAPID JOINING AND BUTT-JOINT CONNECTION CONSTRUCTION METHOD FOR LARGE SPECIAL-SHAPED STEEL ...

Next Patent: RECYCLED AGGREGATE PREPARATION APPARATUS HAVING ENHANCED CARBON SEQUESTRATION AND BASED ON CRUSHED R...