Title:
MEMORY TESTING METHOD, STORAGE MEDIUM, AND COMPUTER DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/190630
Kind Code:
A1
Abstract:
Provided in the present disclosure are a memory testing method, a storage medium, and a computer device. The memory testing method comprises: a target testing sample to be written to a plurality of chip interfaces is obtained, a plurality of the chip interfaces being connected in a one-to-one correspondence with a plurality of physical communication interfaces; second information for the chip interfaces respectively corresponding to first information for each physical communication interface is determined, and use the first information and the second information to serve as correspondence connection information; remapping is performed on the correspondence connection information, and map connection information is obtained; an initial testing sample to be written to the physical communication interfaces is determined according to the target testing sample and the map connection information. The present disclosure is able to improve testing accuracy.
More Like This:
Inventors:
LONG GUANGTENG (CN)
HE HAO (CN)
LU DAN (CN)
HU BO (CN)
HE HAO (CN)
LU DAN (CN)
HU BO (CN)
Application Number:
PCT/CN2021/083247
Publication Date:
September 30, 2021
Filing Date:
March 26, 2021
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G06F11/22
Foreign References:
| US20140376320A1 | 2014-12-25 | |||
| CN105931670A | 2016-09-07 | |||
| CN106652897A | 2017-05-10 | |||
| US10303543B1 | 2019-05-28 |
Attorney, Agent or Firm:
BEIJING INTELLEGAL INTELLECTUAL PROPERTY AGENT LTD. (CN)
Download PDF: