Title:
METHOD AND APPARATUS FOR DETECTING TRACE SUBSTANCES BY SURFACE-ENHANCED RAMAN SCATTERING (SERS), AND MICROCHANNEL CHIP FOR DETECTION OF MICROANALYTE
Document Type and Number:
WIPO Patent Application WO/2007/060989
Kind Code:
A1
Abstract:
This invention provides a method and apparatus for detecting trace substances with
a SERS substrate that are highly practical and can realize rapid observation. In
the method, a microanalyte is discriminated and detected using surface-enhanced Raman
scattered light obtained by applying a laser beam to a site at which an analyte is
close to metallic fine particles. The method comprises the steps of mixing an
analyte with a previously provided metallic fine particle colloid, supplying the
mixture of the analyte with the metallic fine particle colloid to a solid plane, on
which a plurality of juxtaposed grooves or a plurality of juxtaposed recesses are
arranged, along the direction of the arrangement of the grooves or recesses, drying
the supplied mixture on the solid plane, and applying a laser beam onto the dried
mixture in the grooves or recesses on the solid plane to observe Raman scattered
light. The Raman scattered light is observed by applying a laser beam to the dried
product formed in the plurality of juxtaposed grooves or the plurality of juxtaposed
recesses. The solid surface may also be a metallic surface having a plasmon mirror
effect.
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Inventors:
MARUI TOMOHIRO (JP)
SEKIGUCHI AKITO (JP)
SEKIGUCHI AKITO (JP)
Application Number:
PCT/JP2006/323314
Publication Date:
May 31, 2007
Filing Date:
November 22, 2006
Export Citation:
Assignee:
INTELLECTUAL PROPERTY BANK (JP)
MARUI TOMOHIRO (JP)
SEKIGUCHI AKITO (JP)
MARUI TOMOHIRO (JP)
SEKIGUCHI AKITO (JP)
International Classes:
G01N21/65
Foreign References:
| JP2003530569A | 2003-10-14 | |||
| JP2005519622A | 2005-07-07 |
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