Title:
METHOD AND APPARATUS FOR IN-CIRCUIT IMPEDANCE MEASUREMENT
Document Type and Number:
WIPO Patent Application WO2003052429
Kind Code:
A3
Abstract:
A device (10) for measuring an impedance (Z>2<) between first and second nodes (22, 24) in an electrical circuit (18) without removing components includes at least one current source (62 and/or 66) to provide first and second currents or current signals (i>0<, I>1<) of known values. First and second probes (30, 34) contact the respective first and second nodes to apply the first and second currents. A third common probe (46) contacts the circuit at a common node (50) that experiences the same current flow as between the first and second nodes. At least one voltage meter (70 and/or 74) measures voltages (V>00<, V>01<, V>11< AND V>10<) corresponding to the first and second currents. A processor (100) calculates the impedance based on the known values of the currents, and the measured values of the voltages.
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Inventors:
DAVIS LARRY J
COX KENNETH M
COX KENNETH M
Application Number:
PCT/US2002/040424
Publication Date:
February 26, 2004
Filing Date:
December 17, 2002
Export Citation:
Assignee:
SIGNUS INC (US)
International Classes:
G01R27/02; G01R27/16; G01R31/27; G01R31/28; (IPC1-7): G01R27/08
Foreign References:
| US5627476A | 1997-05-06 | |||
| US4540002A | 1985-09-10 | |||
| US4870341A | 1989-09-26 |
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