Title:
METHOD FOR CALIBRATING THE TIME AXIS IN TIME - DOMAIN TERAHERTZ WAVE MEASURING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2011/111385
Kind Code:
A1
Abstract:
The present invention provides a terahertz wave measuring apparatus and measurement method capable of improving the quantitativeness of obtained frequency spectrum information. In a measurement method in which a terahertz wave measuring apparatus is used, the terahertz wave measuring apparatus measures a time waveform of a terahertz wave relating to a calibration sample whose shape of a calibration spectrum is already known and obtains a measurement spectrum by transforming the time waveform. The calibration spectrum and the measurement spectrum are compared, and, on the basis of results of the comparison, time intervals of measurement data that form a time waveform are adjusted in order to calibrate the terahertz wave measuring apparatus.
Inventors:
ITSUJI TAKEAKI (JP)
Application Number:
PCT/JP2011/001384
Publication Date:
September 15, 2011
Filing Date:
March 09, 2011
Export Citation:
Assignee:
CANON KK (JP)
ITSUJI TAKEAKI (JP)
ITSUJI TAKEAKI (JP)
International Classes:
G01J3/42; G01N21/27; G01N21/35; G01N21/3586
Foreign References:
| JP2007101370A | 2007-04-19 | |||
| US20090302223A1 | 2009-12-10 | |||
| US20090198466A1 | 2009-08-06 | |||
| JP2002139420A | 2002-05-17 | |||
| JP2007101370A | 2007-04-19 | |||
| JP2010056197A | 2010-03-11 |
Attorney, Agent or Firm:
ABE, Takuma et al. (30-2 Shimomaruko 3-chome, Ohta-k, Tokyo 01, JP)
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Claims: