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Patent Searching and Data


Title:
METHOD FOR EVALUATING STRUCTURAL CHANGE DURING PRODUCTION PROCESS, AND ANALYSIS PROGRAM
Document Type and Number:
WIPO Patent Application WO/2016/092615
Kind Code:
A1
Abstract:
Changes in isotopic distribution over time are evaluated by artificially introducing areas having different isotopic ratios into a metal material before sintering, heat treatment, and grain boundary diffusion, and comparing atom probe analysis results before and after the sintering, heat treatment, and grain boundary diffusion.

Inventors:
NAKAYAMA TAKESHI (JP)
KOGUCHI MASANARI (JP)
Application Number:
PCT/JP2014/082423
Publication Date:
June 16, 2016
Filing Date:
December 08, 2014
Export Citation:
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Assignee:
HITACHI LTD (JP)
International Classes:
G01N1/28; G01N27/62; G01N1/32
Foreign References:
JPH08114612A1996-05-07
Other References:
MOUTANABBIR O ET AL.: "Ultraviolet- laser atom- probe tomographic three-dimensional atom-by- atom mapping of isotopically modulated Si nanoscopic layers", APPLIED PHYSICS LETTERS, vol. 98, no. 1, pages 013111-1 - 013111-3
THUVANDER M ET AL.: "APFIM Studies of Grain and Phase Boundaries: A Review", MATERIALS CHARACTERIZATION, vol. 44, no. 1-2, January 2000 (2000-01-01), pages 87 - 100
JUN TAKAHASHI ET AL.: "Progress of three- dimensional atom probe techniques for analysis of steel materials: development of atom probe specimen preparation techniques for site- specific regions", SHINNITTETSU GIHO, no. 390, 2010, pages 20 - 27
Attorney, Agent or Firm:
HIRAKI Yusuke et al. (JP)
Yusuke Hiraki (JP)
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