METHOD FOR INSPECTING SCANNING QUALITY, CONTROLLER, AND DEVICE

WIPO Patent Application WO/2019/052212

A1

The present application relates to the field of security check, and provides a method for inspecting scanning quality, a controller, and a device. The method for inspecting scanning quality provided by the present application comprises: obtaining the position of an important part requiring check of a checked person according to an image of the checked person; obtaining a scanning coverage area of a security check instrument according to a video of personal check performed on the checked person by a security checker; and determining the scanning quality according to the degree of matching between the position of the important part requiring check and the scanning coverage area of the security check instrument. By means of the method, the position of an important part requiring check of a checked person can be determined according to an image of the checked person, then a coverage area of a security check instrument can be obtained according to a working image of a security checker, and whether the security check instrument scans the important part requiring check in place can be determined. Thus, the working quality of the security checker can be effectively evaluated, thereby achieving the purpose of improving the working quality of the security checker, and improving the effectiveness of security check and the security of a security check site.

MA YANFANG (CN)
NING HONGZHI (CN)
TIAN LONG (CN)

PCT/CN2018/087702

March 21, 2019

May 21, 2018

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NUCTECH CO LTD (CN)

G06K9/62

CN104965235A	2015-10-07
CN202257964U	2012-05-30
US20040098237A1	2004-05-20

CCPIT PATENT AND TRADEMARK LAW OFFICE (CN)

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