Title:
METHOD FOR MEASURING CHROMIUM CONTENT IN A TUNGSTEN MATRIX WHICH IS ADDED WITH CHROMIUM/CHROMIUM-VANADIUM
Document Type and Number:
WIPO Patent Application WO/2010/066190
Kind Code:
A1
Abstract:
A method for measuring chromium content in a tungsten matrix which is added with chromium/chromium-vanadium comprises the following steps: fusing a sample with sodium peroxide and leaching out with hot water; oxidizing chromium to high valent chromium using sodium peroxide as oxidizer; then, adding ammonium hydrogen fluoride for complexing with tungsten matrix to prevent precipitation of tungstenic acid. For eliminating vanadium interference, adding potassium permanganate solution for oxidizing vanadium, then titrating with ferrous ammonium sulfate standard solution, and calculating chromium content by subtraction method.
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Inventors:
HU YIQI (CN)
Application Number:
PCT/CN2009/075418
Publication Date:
June 17, 2010
Filing Date:
December 09, 2009
Export Citation:
Assignee:
JIANGXI RARE EARTH AND RARE ME (CN)
HU YIQI (CN)
HU YIQI (CN)
International Classes:
G01N21/79; G01N31/16
Foreign References:
| CN101430287A | 2009-05-13 | |||
| CN101173916A | 2008-05-07 | |||
| JPH05142149A | 1993-06-08 | |||
| SU1472822A1 | 1989-04-15 |
Other References:
LI, HUI LING ET AL.: "Study of Measuring Method for the Mixture Added Chromiun and Vanadium", SICHUAN NONFERROUS METALS, no. 2, June 2007 (2007-06-01), pages 37 - 39, XP008147160
Attorney, Agent or Firm:
BEIJING WANG IP AGENCY, LTD. (ZhongGuanCun Tower No. 27 ZhongGuanCun Street, Haidian District, Beijing 0, CN)
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