Title:
METHOD FOR MEASURING VANADIUM CONTENT IN A TUNGSTEN MATRIX TO WHICH VANADIUM/CHROMIUM-VANADIUM HAS BEEN ADDED
Document Type and Number:
WIPO Patent Application WO/2010/066191
Kind Code:
A1
Abstract:
A method for measuring vanadium content in a tungsten matrix to which vanadium/chromium-vanadium has been added comprises the following steps: alkali fusing a sample with sodium peroxide, soaking in water, and dry filtering to obtain a filtrate; reducing chromium and vanadium in the filtrate to low valence with a reducing agent hydroxylamine hydrochloride; adjusting acidity to 4-6 M with nitric acid; and oxidizing vanadium to high valence with potassium permanganate under cool conditions; complexing among obtained high valent vanadium, tungstate radical and orthophosphate radical to obtain a ternary complex; and detecting vanadium content by spectrophotometry. The interference of chromium is eliminated by utilizing the property that, when testing vanadium acidity under cool conditions, potassium permanganate only oxidizes vanadium but does not oxidize chromium.
Inventors:
HU YIQI (CN)
Application Number:
PCT/CN2009/075421
Publication Date:
June 17, 2010
Filing Date:
December 09, 2009
Export Citation:
Assignee:
JIANGXI RARE EARTH AND RARE ME (CN)
HU YIQI (CN)
HU YIQI (CN)
International Classes:
G01N21/79; G01N31/16
Foreign References:
| CN101424644A | 2009-05-06 | |||
| CN101173916A | 2008-05-07 | |||
| JPH05142149A | 1993-06-08 | |||
| SU1472822A1 | 1989-04-15 |
Other References:
LI, HUI LING ET AL.: "Study of Measuring Method for the Mixture Added Chromiun and Vanadium", SICHUAN NONFERROUS METALS, June 2007 (2007-06-01), pages 37 - 39, XP008147160
Attorney, Agent or Firm:
BEIJING WANG IP AGENCY, LTD. (ZhongGuanCun Tower No. 27 ZhongGuanCun Street, Haidian District, Beijing 0, CN)
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