Title:
METHOD FOR MEASURING DNA METHYLATION LEVEL, DISEASE PREDICTION SYSTEM, AND TEST SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/228477
Kind Code:
A1
Abstract:
The present invention can suppress prolonged measurement and an increase in a measurement cost by narrowing down sites (coordinates) in which a DNA methylation level is to be measured. A method for measuring a DNA methylation level comprises: performing machine learning by using a learning data set, which includes the measurement results for a DNA methylation level in a plurality of coordinates and disease information for the measurement results, and producing a learning model that predicts a disease; selecting one or more main components of the measurement results (S903); calculating a factor load quantity which indicates the correlation between the selected one or more main components and the plurality of coordinates (S904); and extracting, from among the plurality of coordinates, a coordinate (item) to be measured in a test to measure a DNA methylation level, on the basis of the calculated factor load quantity (S905).
Inventors:
KAWAI TOMOAKIRA (JP)
Application Number:
PCT/JP2023/002946
Publication Date:
November 30, 2023
Filing Date:
January 30, 2023
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G16B40/20; C12M1/00; C12N15/09; C12Q1/68; C12Q1/6869; C12Q1/6883; G01N33/50
Domestic Patent References:
| WO2021079158A2 | 2021-04-29 |
Foreign References:
| JP6969831B1 | 2021-11-24 | |||
| KR20210044400A | 2021-04-23 | |||
| JP2020010700A | 2020-01-23 |
Attorney, Agent or Firm:
HIRAKI & ASSOCIATES (JP)
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