Title:
METHOD FOR MEASURING SKIN CONDITION AND ELECTRONIC DEVICE THEREFOR
Document Type and Number:
WIPO Patent Application WO/2018/056584
Kind Code:
A1
Abstract:
A method for measuring skin by an electronic device according to various embodiments of the present disclosure comprises: an operation of irradiating at least one light into skin to which a patch is adhered; an operation of detecting at least one reflected light on the basis of an amount of moisture in the skin, which is changed by physiologically active substances injected through the patch, corresponding to the irradiated light; an operation of generating patch adherence information indicating a skin adhesive state of the patch on the basis of the detection result of the at least one reflected light; and an operation of providing the generated patch adherence information to an output unit or a communication unit.
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Inventors:
KIM YOUNG-HYUN (KR)
LEE JEONG-GUN (KR)
CHO SHIN-HEE (KR)
KIM MOO-RIM (KR)
KIM JIN-KYEONG (KR)
PARK MIN-SUN (KR)
LEE SEUNG-JUN (KR)
LEE JEONG-GUN (KR)
CHO SHIN-HEE (KR)
KIM MOO-RIM (KR)
KIM JIN-KYEONG (KR)
PARK MIN-SUN (KR)
LEE SEUNG-JUN (KR)
Application Number:
PCT/KR2017/009012
Publication Date:
March 29, 2018
Filing Date:
August 18, 2017
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
A61B5/00
Foreign References:
| JP2011200465A | 2011-10-13 | |||
| US20160129279A1 | 2016-05-12 | |||
| JP2015142718A | 2015-08-06 | |||
| KR101224629B1 | 2013-01-22 | |||
| KR20140022607A | 2014-02-25 |
Other References:
None
See also references of EP 3517023A4
See also references of EP 3517023A4
Attorney, Agent or Firm:
KIM, Tae-hun et al. (KR)
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