METHOD FOR THE SCANNING MEASUREMENT OF A SURFACE CONTOUR

Title:

METHOD FOR THE SCANNING MEASUREMENT OF A SURFACE CONTOUR

Document Type and Number:

WIPO Patent Application WO2003008900

Kind Code:

B1

Abstract:

The invention relates to a method for the scanning measurement of a surface contour of a workpiece mounted about a rotating or pivoting axis, by means of a co-ordinate measuring device and a sensor which may be displaced along the Cartesian co-ordinates thereof. According to the invention, a surface contour of a workpiece may be determined with extreme precision, in particular, large vertical profiling may be precisely recorded, whereby the sensor and the workpiece are arranged during the measurement relative to each other such that the sensing direction of the sensor at each measuring point is at a constant angle alpha to the surface normals at the measuring point.

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Inventors:

CHRISTOPH RALF (DE)
HAMMER MICHAEL (DE)

Application Number:

PCT/EP2002/007470

Publication Date:

March 27, 2003

Filing Date:

July 05, 2002

Export Citation:

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Assignee:

WERTH MESSTECHNIK GMBH (DE)
CHRISTOPH RALF (DE)
HAMMER MICHAEL (DE)

International Classes:

B23Q17/20; B23Q17/24; G01B11/00; G01B21/04; (IPC1-7): G01B11/03; B23Q1/52; B23Q17/24; G01B21/04; G05B19/42

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