Title:
METHOD AND SYSTEM FOR ANALYSIS FOR NONMETALLIC ELEMENT
Document Type and Number:
WIPO Patent Application WO/2013/099952
Kind Code:
A1
Abstract:
Provided are an analytical method and an analytical system with which impurities, such as nonmetallic elements, contained in a sample, e.g., an organic semiconductor material, can be easily detected precisely with high sensitivity. The method comprises: the step of bringing an organic semiconductor material into contact with supercritical water or subcritical water; and the step of detecting any nonmetallic element contained in the supercritical water or subcritical water which has been contacted with the organic semiconductor material. By the method, an organic semiconductor material which is solid is analyzed for nonmetallic elements.
Inventors:
IMANISHI KATSUYA (JP)
OHASHI KAZUTOSHI (JP)
TSUKAGOSHI AKIHIKO (JP)
OHASHI KAZUTOSHI (JP)
TSUKAGOSHI AKIHIKO (JP)
Application Number:
PCT/JP2012/083668
Publication Date:
July 04, 2013
Filing Date:
December 26, 2012
Export Citation:
Assignee:
SUMIKA CHEM ANALYSIS SERVICES (JP)
International Classes:
G01N1/28; G01N31/00
Foreign References:
| JP2003347624A | 2003-12-05 | |||
| JP2003075406A | 2003-03-12 | |||
| JP2002282816A | 2002-10-02 |
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK (JP)
Patent business corporation Hara [Kenzo] international patent firm (JP)
Patent business corporation Hara [Kenzo] international patent firm (JP)
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Claims: