Title:
METHOD AND SYSTEM FOR MEASURING OPTICAL SCATTERING CHARACTERISTICS
Document Type and Number:
WIPO Patent Application WO2002086439
Kind Code:
A3
Abstract:
A method and system for measuring optical scattering characteristics includes coupling a continuous wave laser excitation signal to an optical fiber. Radiation backscattered by the optical fiber in response to the coupled excitation signal is detected to produce a backscattered radiation signal. The backscattered radiation signal is mixed with the excitation signal to produce a mixed signal. The mixed signal is filtered to reduce the magnitude of frequencies other than conjugate mixing frequencies relative to the conjugate mixing frequencies. The filtered signal is digitized and themagnitude of backscattered radiation from a specific portion of the fiber is calculated based on the digitized signal. The temperature of a specific portion of the fiber can be determined from the magnitude of the backscattered radiation.
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Inventors:
FREDIN LEIF
CHIN ROBERT
HALLIDAY WILLIAM
CHIN ROBERT
HALLIDAY WILLIAM
Application Number:
PCT/US2002/012882
Publication Date:
December 04, 2003
Filing Date:
April 23, 2002
Export Citation:
Assignee:
SYSTEMS AND PROCESSES ENGINEER (US)
International Classes:
G01K11/32; G01M11/00; (IPC1-7): G01M11/00; G01L1/24
Foreign References:
US4630228A | 1986-12-16 | |||
EP0320255A2 | 1989-06-14 | |||
EP0403094A2 | 1990-12-19 | |||
US5094526A | 1992-03-10 | |||
US4674872A | 1987-06-23 | |||
US5526109A | 1996-06-11 | |||
US5054935A | 1991-10-08 | |||
US5449233A | 1995-09-12 | |||
US6191846B1 | 2001-02-20 |
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