Title:
METHOD, SYSTEM, AND TARGET FOR SETTING REFERENCE POINTS ON STRUCTURE
Document Type and Number:
WIPO Patent Application WO/2015/045020
Kind Code:
A1
Abstract:
A target (10) placed on a position-adjustment mechanism (30) is affixed to each of a plurality of reference points (S1 through S16) on a structure (1), and initial 3D coordinates (C0) for each target (10) are determined and stored. After the structure (1) undergoes deformation, for each target (10), 3D coordinates (Ct) are determined, the deviation (ΔC = Ct-C0) thereof from the corresponding initial 3D coordinates (C0) is calculated, and in accordance with said deviation (ΔC), the corresponding position-adjustment mechanism (30) is used to move that target (10) back to the corresponding initial 3D coordinates (C0). Preferably, the 3D coordinates for each target (10) are determined using a 3D measuring instrument (18) that sights that target (10) and outputs a 3D vector representing the position thereof relative to the 3D measuring instrument (18). Each position-adjustment mechanism (30) could comprise: a guide platform (31, 34) that guides the target (10) along one axis or two perpendicular axes parallel to the surface (F) of the structure; and a drive mechanism (40a, 40b) that moves the target (10) along the guide platform (31, 34) by a prescribed amount.
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Inventors:
MURATA TOYOTOSHI (JP)
YAMAMOTO KAZUHITO (JP)
YAMAMOTO KAZUHITO (JP)
Application Number:
PCT/JP2013/075829
Publication Date:
April 02, 2015
Filing Date:
September 25, 2013
Export Citation:
Assignee:
BIG SURVEY & DESIGN CO LTD (JP)
International Classes:
G01C15/06; G01C15/00
Foreign References:
| JPH07134029A | 1995-05-23 | |||
| JP2009097985A | 2009-05-07 | |||
| JP2012173130A | 2012-09-10 | |||
| JP2012189612A | 2012-10-04 |
Attorney, Agent or Firm:
SHITO Atsushi et al. (JP)
市東 篤 (JP)
市東 篤 (JP)
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