Title:
METHODS AND APPARATUSES FOR TEMPERATURE INDEPENDENT DELAY CIRCUITRY
Document Type and Number:
WIPO Patent Application WO/2020/077558
Kind Code:
A1
Abstract:
Methods and apparatuses are provided for temperature independent resistive-capacitive delay circuits of a semiconductor device. For example, delays associated with ZQ calibration or timing of the RAS chain may be implemented that to include circuitry that exhibits both proportional to absolute temperature (PTAT) characteristics and complementary to absolute temperature (CTAT) characteristics in order to control delay times across a range of operating temperatures. The RC delay circuits may include a first type of circuitry having impedance with PTAT characteristics that is coupled to an output node in parallel with a second type of circuitry having impedance with CTAT characteristics. The first type of circuitry may include a resistor and the second type of circuitry may include a transistor, in some embodiments.
Inventors:
CHU WEILU (CN)
PAN DONG (US)
HUANG ZHIQI (CN)
PAN DONG (US)
HUANG ZHIQI (CN)
Application Number:
PCT/CN2018/110623
Publication Date:
April 23, 2020
Filing Date:
October 17, 2018
Export Citation:
Assignee:
MICRON TECHNOLOGY INC (US)
International Classes:
H03L7/00
Foreign References:
| US20130093522A1 | 2013-04-18 | |||
| CN1210393A | 1999-03-10 | |||
| CN1296665A | 2001-05-23 |
Attorney, Agent or Firm:
LEE AND LI - LEAVEN IPR AGENCY LTD. (CN)
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