METHODS AND SYSTEMS FOR ASCERTAINING FACTORS CONTRIBUTING TO THE TEMPERATURE OF A DEVICE

Title:

METHODS AND SYSTEMS FOR ASCERTAINING FACTORS CONTRIBUTING TO THE TEMPERATURE OF A DEVICE

Document Type and Number:

WIPO Patent Application WO/2021/157930

Kind Code:

A1

Abstract:

Methods and systems for ascertaining factors contributing to the temperature of a device. A method includes monitoring a plurality of parameters that are contributing to a temperature of the device. The method also includes estimating a degree of contribution of internal factors to the temperature of the device based on the monitored plurality of parameters and a battery temperature of a battery of the device. The method further includes estimating a degree of contribution of external factors to the temperature of the device, based on the monitored plurality of parameters and a battery temperature of a battery of the device. A neural network can be used for estimating the temperature of the ambience of the device and the impacts of internal and external factors on temperature of the device.

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Inventors:

JHAWAR ADITYA (IN)
JAISWAL ADITI (IN)
JACOB JAITIRTH ANTHONY (IN)
SAHNI NIKHIL (IN)
KIM HAKRYOUL (KR)
KIM JONGWOO (KR)
BANG SUNGYONG (KR)
JUNG SUNGHUN (KR)
JHA SURAJ (IN)
CHIRAYIL SUDHEESH BABU VAISAKH PUNNEKKATTU (IN)
NAIR RENJU CHIRAKAROTU (IN)

Application Number:

PCT/KR2021/001001

Publication Date:

August 12, 2021

Filing Date:

January 26, 2021

Export Citation:

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Assignee:

SAMSUNG ELECTRONICS CO LTD (KR)

International Classes:

G06F1/20; G06F11/30; G06N3/02; H02J7/00

Domestic Patent References:

WO2019059000A1

2019-03-28

Foreign References:

US20190293494A1	2019-09-26
US20160252268A1	2016-09-01
US20090072795A1	2009-03-19
US20030231006A1	2003-12-18